Instruments & Instrumentation 期刊：按影响因子、JCR 分区与中科院分区浏览 Web of Science「Instruments & Instrumentation」学科，并核对索引收录。共 81 种期刊，按影响因子排序。
按影响因子降序展示前 81 / 共 81 种期刊（字段与主站一致：IF · JCR · 中科院 · 索引 · 出版商）。
| # | 期刊 | 影响因子 | JCR 分区 | 中科院 | 索引 | 出版商 |
|---|---|---|---|---|---|---|
| 1 | MICROSYSTEMS & NANOENGINEERING | 11.1 | Q1 | 1区 | SCIE, EI | SPRINGERNATURE |
| 2 | SENSORS AND ACTUATORS B-CHEMICAL | 8.3 | Q1 | 1区 | SCIE, EI | ELSEVIER SCIENCE SA |
| 3 | APPLIED SPECTROSCOPY REVIEWS | 7.7 | Q1 | 2区 | SCIE, EI | TAYLOR & FRANCIS INC |
| 4 | IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS | 7.4 | Q1 | 1区 | SCIE, EI | IEEE |
| 5 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 7 | Q1 | 2区 | SCIE, EI | IEEE |
| 6 | PHOTOACOUSTICS | 6.9 | Q1 | 1区 | SCIE, EI | ELSEVIER GMBH |
| 7 | SENSORS AND ACTUATORS REPORTS | 6.9 | Q1 | 2区 | SCIE, ESCI, EI | ELSEVIER |
| 8 | ISA TRANSACTIONS | 6.6 | Q1 | 2区 | SCIE, EI | ELSEVIER SCIENCE INC |
| 9 | NANOMANUFACTURING AND METROLOGY | 6.5 | Q1 | 4区 | ESCI, EI | SPRINGERNATURE |
| 10 | LAB ON A CHIP | 6.3 | Q1 | 2区 | SCIE, EI | ROYAL SOC CHEMISTRY |
| 11 | BIOSENSORS-BASEL | 6.2 | Q1 | 3区 | SCIE, EI | MDPI |
| 12 | MEASUREMENT | 6.1 | Q1 | 2区 | SCIE, EI | ELSEVIER SCI LTD |
| 13 | ADVANCED DEVICES & INSTRUMENTATION | 6 | Q1 | — | ESCI, EI | AMER ASSOC ADVANCEMENT SCIENCE |
| 14 | STRUCTURAL HEALTH MONITORING-AN INTERNATIONAL JOURNAL | 5.7 | Q1 | 2区 | SCIE, EI | SAGE PUBLICATIONS LTD |
| 15 | SENSORS AND ACTUATORS A-PHYSICAL | 5.1 | Q1 | 3区 | SCIE, EI | ELSEVIER SCIENCE SA |
| 16 | ADVANCED SENSOR RESEARCH | 5 | Q1 | — | ESCI, EI | WILEY-V C H VERLAG GMBH |
| 17 | STRUCTURAL CONTROL & HEALTH MONITORING | 5 | Q1 | 2区 | SCIE, EI | WILEY |
| 18 | PHOTONIC SENSORS | 4.6 | Q1 | 1区 | SCIE, EI | TSINGHUA UNIV PRESS |
| 19 | ROMANIAN JOURNAL OF INFORMATION SCIENCE AND TECHNOLOGY | 4.6 | Q1 | 4区 | SCIE | EDITURA ACAD ROMANE |
| 20 | IEEE SENSORS JOURNAL | 4.5 | Q1 | 3区 | SCIE, EI | IEEE |
| 21 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 4.5 | Q1 | 2区 | SCIE, EI | ELSEVIER SCIENCE INC |
| 22 | CHEMOSENSORS | 4.4 | Q2 | 3区 | SCIE, EI | MDPI |
| 23 | QUANTITATIVE INFRARED THERMOGRAPHY JOURNAL | 4.4 | Q1 | 2区 | SCIE, EI | TAYLOR & FRANCIS LTD |
| 24 | SENSORS | 4 | Q2 | 3区 | SCIE, EI | MDPI |
| 25 | DISPLAYS | 3.9 | Q2 | 2区 | SCIE, EI | ELSEVIER |
| 26 | CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS | 3.8 | Q1 | 2区 | SCIE, EI | ELSEVIER |
| 27 | INFRARED PHYSICS & TECHNOLOGY | 3.8 | Q2 | 2区 | SCIE, EI | ELSEVIER |
| 28 | SMART MATERIALS AND STRUCTURES | 3.8 | Q2 | 3区 | SCIE, EI | IOP PUBLISHING LTD |
| 29 | MEASUREMENT SCIENCE AND TECHNOLOGY | 3.7 | Q1 | 3区 | SCIE, EI | IOP PUBLISHING LTD |
| 30 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | 3.5 | Q2 | 3区 | SCIE, EI | IEEE |
| 31 | MICROMACHINES | 3.5 | Q2 | 3区 | SCIE, EI | MDPI |
| 32 | JOURNAL OF GUIDANCE CONTROL AND DYNAMICS | 3.4 | Q1 | 3区 | SCIE, EI | AMER INST AERONAUTICS ASTRONAUTICS |
| 33 | FLOW MEASUREMENT AND INSTRUMENTATION | 3.3 | Q2 | 3区 | SCIE, EI | ELSEVIER SCI LTD |
| 34 | METROLOGIA | 3.2 | Q2 | 3区 | SCIE, EI | IOP PUBLISHING LTD |
| 35 | EPJ TECHNIQUES AND INSTRUMENTATION | 3 | Q2 | 4区 | ESCI, EI | SPRINGER |
| 36 | MICROFLUIDICS AND NANOFLUIDICS | 2.9 | Q2 | 4区 | SCIE, EI | SPRINGER HEIDELBERG |
| 37 | SENSING AND IMAGING | 2.9 | Q2 | 4区 | ESCI, EI | SPRINGER |
| 38 | JOURNAL OF SYNCHROTRON RADIATION | 2.8 | Q2 | 3区 | SCIE, EI | INT UNION CRYSTALLOGRAPHY |
| 39 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 2.5 | Q2 | 4区 | SCIE, EI | IOP PUBLISHING LTD |
| 40 | ACTUATORS | 2.4 | Q2 | 3区 | SCIE | MDPI |
| 41 | IEEE SENSORS LETTERS | 2.4 | Q2 | 4区 | ESCI, EI | IEEE |
| 42 | MEASUREMENT & CONTROL | 2.3 | Q3 | 4区 | SCIE, EI | SAGE PUBLICATIONS LTD |
| 43 | SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES | 2.3 | Q2 | 4区 | SCIE, EI | IOP PUBLISHING LTD |
| 44 | APPLIED SPECTROSCOPY | 2.2 | Q2 | 3区 | SCIE, EI | SAGE PUBLICATIONS INC |
| 45 | METROLOGY | 2.1 | Q3 | — | ESCI | MDPI |
| 46 | IEEE OPEN JOURNAL OF INSTRUMENTATION AND MEASUREMENT | 2 | Q3 | — | ESCI, EI | IEEE |
| 47 | IET CONTROL THEORY AND APPLICATIONS | 2 | Q3 | 4区 | SCIE, EI | WILEY |
| 48 | INTERNATIONAL JOURNAL OF PROGNOSTICS AND HEALTH MANAGEMENT | 2 | Q2 | 4区 | ESCI | PHM SOCIETY |
| 49 | JOURNAL OF CHEMOMETRICS | 2 | Q1 | 4区 | SCIE, EI | WILEY |
| 50 | JOURNAL OF NONDESTRUCTIVE EVALUATION, DIAGNOSTICS AND PROGNOSTICS OF ENGINEERING SYSTEMS | 2 | Q2 | 4区 | ESCI, EI | ASME |
| 51 | HARDWAREX | 1.9 | Q3 | 4区 | ESCI, EI | ELSEVIER |
| 52 | JOURNAL OF SENSORS | 1.9 | Q3 | 4区 | SCIE, EI | WILEY |
| 53 | SENSOR REVIEW | 1.9 | Q3 | 4区 | SCIE, EI | EMERALD GROUP PUBLISHING LTD |
| 54 | TRANSACTIONS OF THE INSTITUTE OF MEASUREMENT AND CONTROL | 1.8 | Q3 | 4区 | SCIE, EI | SAGE PUBLICATIONS LTD |
| 55 | IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 1.7 | Q3 | 4区 | SCIE, EI | IEEE |
| 56 | JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY | 1.6 | Q3 | 4区 | SCIE, EI | SAGE PUBLICATIONS INC |
| 57 | REVIEW OF SCIENTIFIC INSTRUMENTS | 1.6 | Q3 | 4区 | SCIE, EI | AIP PUBLISHING |
| 58 | JOURNAL OF ASTRONOMICAL TELESCOPES INSTRUMENTS AND SYSTEMS | 1.5 | Q3 | 4区 | SCIE, EI | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS |
| 59 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1.5 | Q3 | 3区 | SCIE, EI | ELSEVIER |
| 60 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1.5 | Q3 | 3区 | SCIE, EI | ELSEVIER |
| 61 | INSTRUMENTS | 1.4 | Q4 | — | ESCI | MDPI |
| 62 | JOURNAL OF INSTRUMENTATION | 1.4 | Q4 | 4区 | SCIE, EI | IOP PUBLISHING LTD |
| 63 | MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA | 1.4 | Q4 | 4区 | SCIE | METROLOGY SOC INDIA |
| 64 | SMART STRUCTURES AND SYSTEMS | 1.4 | Q3 | 4区 | SCIE, EI | TECHNO-PRESS |
| 65 | MEASUREMENT SCIENCE REVIEW | 1.3 | Q4 | 4区 | SCIE, EI | PARADIGM PUBLISHING SERVICES-DE GRUYTER BRILL SP ZOO |
| 66 | METROLOGY AND MEASUREMENT SYSTEMS | 1.3 | Q4 | 4区 | SCIE, EI | POLSKA AKAD NAUK, POLISH ACAD SCIENCES |
| 67 | QUANTUM BEAM SCIENCE | 1.3 | Q3 | 4区 | ESCI | MDPI |
| 68 | ROBOMECH JOURNAL | 1.3 | Q4 | 4区 | ESCI, EI | SPRINGERNATURE |
| 69 | JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME | 1.2 | Q4 | 4区 | SCIE, EI | ASME |
| 70 | JOURNAL OF SENSORS AND SENSOR SYSTEMS | 1.2 | Q4 | 4区 | ESCI, EI | COPERNICUS GESELLSCHAFT MBH |
| 71 | ACCREDITATION AND QUALITY ASSURANCE | 1.1 | Q4 | 4区 | SCIE | SPRINGER |
| 72 | SENSORS AND MATERIALS | 1.1 | Q4 | 4区 | SCIE, EI | MYU, SCIENTIFIC PUBLISHING DIVISION |
| 73 | INSTRUMENTATION SCIENCE & TECHNOLOGY | 1 | Q4 | 4区 | SCIE, EI | TAYLOR & FRANCIS INC |
| 74 | ACTA IMEKO | 0.9 | Q4 | — | ESCI | IMEKO - INT MEASUREMENT CONFEDERATION |
| 75 | INSIGHT | 0.8 | Q4 | 4区 | SCIE, EI | BRITISH INST NON-DESTRUCTIVE TESTING |
| 76 | TM-TECHNISCHES MESSEN | 0.8 | Q4 | 4区 | SCIE, EI | WALTER DE GRUYTER GMBH |
| 77 | AUTOMATION AND REMOTE CONTROL | 0.5 | Q4 | 4区 | SCIE, EI | PLEIADES PUBLISHING LTD |
| 78 | MEASUREMENT TECHNIQUES | 0.5 | Q4 | 4区 | ESCI, EI | SPRINGER |
| 79 | INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 0.4 | Q4 | 4区 | SCIE, EI | PLEIADES PUBLISHING LTD |
| 80 | DEVICES AND METHODS OF MEASUREMENTS | 0.2 | Q4 | 4区 | ESCI | BELARUSIAN NATL TECHNICAL UNIV |
| 81 | UKRAINIAN METROLOGICAL JOURNAL | 0.2 | Q4 | 4区 | ESCI | NATL SCIENTIFIC CENTER INST METROLOGY |