International Scientific Symposium Metrology And Metrology Assurance, Mma
Publisher: Institute of Electrical and Electronics Engineers Inc. · eISSN 2534-9325
Journal Overview
International Scientific Symposium Metrology And Metrology Assurance, Mma is a scholarly journal connected with research in its scholarly field. It is published by Institute of Electrical and Electronics Engineers Inc.. The journal is currently tagged in AILatest with Scopus coverage information. Researchers can use this page to review indexing coverage, ranking signals, open access information, publication volume, risk signals, and similar journals before deciding whether to explore the journal further. The information is intended as a starting point for journal discovery and should be checked against the journal's official instructions before submission.
Frequently Asked Questions
What is the Impact Factor of International Scientific Symposium Metrology And Metrology Assurance, Mma?
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Is International Scientific Symposium Metrology And Metrology Assurance, Mma open access?
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International Scientific Symposium Metrology And Metrology Assurance, Mma is marked with these coverage badges: Scopus.
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